Vistec sensors get global orders
A Japanese sensor manufacturer has ordered two fully automated infrared inspection and review systems IRIS2000, according to Vistec Semiconductor Systems.
The Vistec IRIS2000 will be used to control glued wafers in a production line where each sensor must be inspected.
Using the well proven Smart Defect Inspection (SDI) method based on a dynamic reference image enables reliable wafer control, independent of normal process variations, the company says.
In Europe, a MEMS manufacturer has ordered two Vistec INM100 IR infrared inspection systems.
The INM100 IR can also be used to control the quality of the overlay of flip chip and wafer level packaging technologies, Vistec says.