Cleaning verification procedure cuts swab and rinse analysis time

Published: 28-Jan-2009

D3 Technologies, a Glasgow-based provider of trace level detection technology, has developed a new cleaning verification procedure which the company claims cuts swab and rinse analysis time from days to hours, significantly reducing production downtime.

The test uses D3’s patented Klarite substrate technology and Surface-Enhanced Raman Spectroscopy (SERS) knowledge, which it says is a simple, easy to adopt procedure that provides highly reproducible results.

Klarite is capable of detecting trace quantities of analytes down to parts per billion levels. In addition, all components in an analytical mixture can be detected simultaneously, overcoming the need to ‘search’ for contaminants. A robust calibration curve can be generated so that known analytes can be readily quantified.

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