High-volume sensor testing
Advantest America has launched the M4551A dynamic test handler, which has been optimised for high-resolution CCD and CMOS image sensors, such as those found in today's most advanced digital cameras. Designed to meet test demands with enhanced reliability and yields, the dynamic test handler enables testing of up to eight devices simultaneously to deliver a maximum throughput of 2,200 devices per hour. Advantest America president and CEO Keith Lee said: "The M4551A was designed to provide a high-volume, high-performance and ultra-clean test solution. To meet more stringent particle specifications, it incorporates a device handling mechanism that minimises microscopic dust particles caused by mechanical friction. When the resulting Class 100 cleanliness levels are coupled with the M4551A's productivity, reliability and yield advantages, mass-production testing of current and future high-resolution image sensors is greatly enhanced."